Authors:

Marlen Jones

Date Created:

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About Paper:

Understanding how radiation effects microelectronic devices is critical for predicting their performance in extreme environments. With the growing interest in space applications and engineering advancements, it is crucial to evaluate the reliability of devices in high radiation environments. To predict and track the performance of microelectronic devices, radiation effects testing must be completed in known radiation flux conditions. This research aims to quantify the total neutron flux within Purdue's subcritical pile. The Purdue subcritical pile is a research facility used for radiation effects testing and education. It is composed of graphite, natural uranium, and external neutrons sources, and operates based on the principles of fission, moderation, and absorption. The makeup of the pile works to transfer neutrons throughout its volume, however, maintains a subcritical state, making it a safe and controllable testing environment. This makes it useful for experiments and testing electronics in a radiation environment without operating a full nuclear reactor with the goal of developing a comprehensive flux map of the pile. Indium-115 foils are exposed to the neutron flux in the pile at varying locations, and the decay of their activated isotope is measured using a scintillation detector and converted into a flux value. By measuring the neutron flux of multiple foils at various locations, a heat map was created, displaying the flux distribution throughout the pile. Future work includes comparisons against Monte Carlo simulated models, conducting further measurements, and integrating those taken into ML program, aimed at predicting the flux in locations not directly measured. Keywords: Subcritical Pile; Neutron Activation; Flux Mapping

Source:

Purdue University / 2025

Topics:

No topics listed

Co-authors:

Marlen Jones