Authors:

Colin J Keeter

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About Paper:

Radio frequency (RF) devices are frequently exposed to harsh environmental conditions, including temperature extremes and ionizing radiation. This study investigates whether signal feature variations caused by temperature changes exhibit similar patterns to those induced by radiation exposure. Specifically, we analyze how signal characteristics-such as carrier frequency offset (CFO), signal-to-noise ratio (SNR), and other relevant metrics-respond to increasing temperature and compare these trends to previously collected total ionizing dose (TID) radiation data. Using data from four emitters subjected to controlled thermal testing and corresponding radiation tests, signal features were extracted from 802.11a waveforms and analyzed through statistical metrics including mean, skewness, and kurtosis. Our findings suggest potential similarities in the behavioral trends of CFO under both thermal and radiation stress, which could have implications for cost-efficient testing protocols. This research contributes to understanding whether temperature testing can serve as a proxy for certain aspects of radiation testing, potentially reducing the need for expensive and time-intensive TID experiments. Keywords: Specific Emitter Identification (SEI); Radio Frequency (RF); Carrier Frequency Offset (CFO); Signal-to-Noise Ratio (SNR); Software Defined Ratio (SDR)

Source:

Purdue University / 2025

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Co-authors:

Colin J Keeter